图书情报知识 ›› 2014, Vol. 0 ›› Issue (5): 72-80.doi: 10.13366/j.dik.2014.05.072

• 情报、信息与共享 • 上一篇    下一篇

专利信息计量研究综述

文庭孝   

  • 出版日期:2014-09-10 发布日期:2014-09-10

A Review on Patentometrics Research

  • Online:2014-09-10 Published:2014-09-10

摘要:

专利文献中包含着技术、经济和法律等极为重要的专利信息,具有其独特性。通过专利信息计量与分析可以发现专利信息的数量特征、分布规律和结构关系,在科学、技术、创新、产业、专利竞争、专利战略、专利政策、专利制度等方面具有极为重要的作用,专利信息计量与分析已经成为一个非常庞大的产业。专利信息计量研究的产生与发展经历四个阶段,形成了两个核心研究领域,涌现了一批代表性人物及核心文献。专利信息计量研究的内容包括专利数量分析、专利引用分析和专利关联分析三个领域,国家、组织机构和发明者个人三个层次,理论、指标与方法和应用三个方面。目前专利信息计量研究已经在专利定量分析指标、方法和专利价值评估指标与方法取得了一定的进展。专利信息计量工具是专利信息计量研究的基础,国内外已经开发出了一批实用的专利信息计量软件和工具。专利信息计量研究对发明人、企业、实验室、大学、科研机构、政府部门具有极大的应用价值,具有广泛的应用前景和发展空间。

关键词: 专利计量, 文献计量, 科学计量, 知识计量, 专利分析

Abstract:

There are important information,such as technical,economical and legal informaton in patent literatures,which has peculiarity. We can find the quantitative characteristics, distributed pattern and structure relation by patent measuring and analysis, which can be used widely in science, technology, innovation, industry, patent competition, patent strategy, patent policy, patent system and so on.Patent measuring and analysis has becorning huge industry.The generation and development of patentometrics have experienced four stages, shaped two core research fields, and batch of typical scholars and core literatures. The contents of patentometrics includes three areas, i.e. patent quantitative analysis, patent citation analysis and patent correlation analysis; three levels, i.e. national,institutional framework and inventor; and three aspects, i.e. theories, indicators and methods and application.Some progresses have been made in the researches on indicators and methods of patent quantitative analysis and value assessment.A batch of practical patent analysis tools have been developed, which are the base of quantitative patent analysis.Patentometics has extensivel application and development space in inventors,enterprises, laboratories,universities, research institutes, and governments.

Keywords: Patentometrics, Bibliometrics, Scientometrics, Knowledge measurement, Patent analysis